"Built-in self-test for folded bit-line Mbit DRAMs."

Emil Gizdarski (1996)

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DOI: 10.1016/S0167-9260(96)00007-7

access: closed

type: Journal Article

metadata version: 2020-02-20

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Emil Gizdarski:
Built-in self-test for folded bit-line Mbit DRAMs. Integr. 21(1-2): 95-112 (1996)

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