"Why current secure scan designs fail and how to fix them?"

Aijiao Cui et al. (2017)

> Home

Details and statistics

DOI: 10.1016/J.VLSI.2016.10.011

access: closed

type: Journal Article

metadata version: 2023-05-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/integration/CuiLLQ17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/integration/CuiLLQ17
Aijiao Cui, Yanhui Luo, Huawei Li, Gang Qu:
Why current secure scan designs fail and how to fix them? Integr. 56: 105-114 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.