"Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan ..."

Safa Berrima, Yves Blaquière, Yvon Savaria (2018)

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DOI: 10.1016/J.VLSI.2018.02.010

access: closed

type: Journal Article

metadata version: 2020-02-20

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Safa Berrima, Yves Blaquière, Yvon Savaria:
Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. Integr. 62: 159-169 (2018)

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