"Memory mutation testing."

Fan Wu et al. (2017)

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DOI: 10.1016/J.INFSOF.2016.03.002

access: closed

type: Journal Article

metadata version: 2022-10-02

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Fan Wu, Jay Nanavati, Mark Harman, Yue Jia, Jens Krinke:
Memory mutation testing. Inf. Softw. Technol. 81: 97-111 (2017)

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