"Software defect prediction using stacked denoising autoencoders and ..."

Haonan Tong, Bin Liu, Shihai Wang (2018)

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DOI: 10.1016/J.INFSOF.2017.11.008

access: closed

type: Journal Article

metadata version: 2022-08-16

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Haonan Tong, Bin Liu, Shihai Wang:
Software defect prediction using stacked denoising autoencoders and two-stage ensemble learning. Inf. Softw. Technol. 96: 94-111 (2018)

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