"Learning test-mutant relationship for accurate fault localisation."

Jinhan Kim et al. (2023)

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DOI: 10.1016/J.INFSOF.2023.107272

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type: Journal Article

metadata version: 2023-07-21

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Jinhan Kim, Gabin An, Robert Feldt, Shin Yoo:
Learning test-mutant relationship for accurate fault localisation. Inf. Softw. Technol. 162: 107272 (2023)

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