"Beam profiling by vibrating knife edge: Implications for near-field ..."

A. Korpel, D. J. Mehrl, S. Samson (1990)

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DOI: 10.1002/IMA.1850020306

access: closed

type: Journal Article

metadata version: 2020-06-18

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A. Korpel, D. J. Mehrl, S. Samson:
Beam profiling by vibrating knife edge: Implications for near-field optical scanning microscopy. Int. J. Imaging Syst. Technol. 2(3): 203-208 (1990)

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