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"Cyber security for automatic test equipment."

Neal Young, Ronald Drees (2018)

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DOI: 10.1109/MIM.2018.8423738

access: closed

type: Journal Article

metadata version: 2018-08-06

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Neal Young, Ronald Drees:
Cyber security for automatic test equipment. IEEE Instrum. Meas. Mag. 21(4): 4-8 (2018)

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