"Biases and Uncertainties of RF Noise Power Measurements."

Brett T. Walkenhorst, Ryan T. Cutshall, Daniel R. Frey (2021)

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DOI: 10.1109/MIM.2021.9549231

access: closed

type: Journal Article

metadata version: 2021-10-07

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Brett T. Walkenhorst, Ryan T. Cutshall, Daniel R. Frey:
Biases and Uncertainties of RF Noise Power Measurements. IEEE Instrum. Meas. Mag. 24(7): 50-62 (2021)

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