"Profiling: A promising field for metrologists [Guest Editorial]."

Veronica Scotti (2017)

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DOI: 10.1109/MIM.2017.7864540

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type: Journal Article

metadata version: 2017-05-28

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Veronica Scotti:
Profiling: A promising field for metrologists [Guest Editorial]. IEEE Instrum. Meas. Mag. 20(1): 3 (2017)

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