"Why smart metrology is no longer optional."

Jean-Michel Pou, Laurent Leblond (2020)

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DOI: 10.1109/MIM.2020.9062693

access: closed

type: Journal Article

metadata version: 2020-04-27

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Jean-Michel Pou, Laurent Leblond:
Why smart metrology is no longer optional. IEEE Instrum. Meas. Mag. 23(2): 82-86 (2020)

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