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"The past and future of electronics testing [Trends in Future I&M]."

Melanie Po-Leen Ooi (2018)

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DOI: 10.1109/MIM.2018.8423741

access: closed

type: Journal Article

metadata version: 2022-10-02

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Melanie Po-Leen Ooi:
The past and future of electronics testing [Trends in Future I&M]. IEEE Instrum. Meas. Mag. 21(4): 20-21 (2018)

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