"Machine learning-based anomaly detection via integration of manufacturing, ..."

Taehoon Ko et al. (2017)

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DOI: 10.1108/IMDS-06-2016-0195

access: closed

type: Journal Article

metadata version: 2020-10-26

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Taehoon Ko, Je Hyuk Lee, Hyunchang Cho, Sungzoon Cho, Wounjoo Lee, Miji Lee:
Machine learning-based anomaly detection via integration of manufacturing, inspection and after-sales service data. Ind. Manag. Data Syst. 117(5): 927-945 (2017)

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