"Visual software defect prediction method based on improved recurrent ..."

Liqiong Chen, Yunjie Lei, Huaiying Sun (2024)

> Home

Details and statistics

DOI: 10.1108/IJWIS-07-2024-0200

access: closed

type: Journal Article

metadata version: 2025-01-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijwis/ChenLS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijwis/ChenLS24
Liqiong Chen, Yunjie Lei, Huaiying Sun:
Visual software defect prediction method based on improved recurrent criss-cross residual network. Int. J. Web Inf. Syst. 20(6): 621-638 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.