"Automatic Inspection for etching transistors in TFT-LCD Panel Using Binary ..."

C.-S. Lin et al. (2010)

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DOI: 10.2316/JOURNAL.206.2010.3.206-2987

access: closed

type: Journal Article

metadata version: 2020-02-11

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C.-S. Lin, C.-W. Tsai, C.-M. Tseng, C.-C. Chiu, S.-C. Chang:
Automatic Inspection for etching transistors in TFT-LCD Panel Using Binary Tree Structure and Bintree Searching and Gradient Orientation Code. Int. J. Robotics Autom. 25(3) (2010)

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