"A new lot sentencing approach by variables inspection based on process yield."

Chien-Wei Wu, Shih-Wen Liu (2018)

> Home

Details and statistics

DOI: 10.1080/00207543.2018.1424365

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijpr/WuL18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijpr/WuL18
Chien-Wei Wu, Shih-Wen Liu:
A new lot sentencing approach by variables inspection based on process yield. Int. J. Prod. Res. 56(12): 4087-4099 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.