"A zero suppressed binary decision diagram-based test set relaxation for ..."

Navya Mohan, J. P. Anita (2016)

> Home

Details and statistics

DOI: 10.1504/IJMMNO.2016.074374

access: closed

type: Journal Article

metadata version: 2020-08-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijmno/MohanA16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijmno/MohanA16
Navya Mohan, J. P. Anita:
A zero suppressed binary decision diagram-based test set relaxation for single and multiple stuck-at faults. Int. J. Math. Model. Numer. Optimisation 7(1): 83-96 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.