"Research on fault diagnosis technology based on FD-GT method."

Wei Kang et al. (2020)

> Home

Details and statistics

DOI: 10.1504/IJICT.2020.106321

access: closed

type: Journal Article

metadata version: 2023-07-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijict/KangXXTH20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijict/KangXXTH20
Wei Kang, Jiyang Xiao, Mingqing Xiao, Xilang Tang, Bin Hu:
Research on fault diagnosis technology based on FD-GT method. Int. J. Inf. Commun. Technol. 16(3): 261-274 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.