"Reliability evaluation and redesign methodology for RFCMOS transceiver ..."

Chun-Ting Hsieh et al. (2021)

> Home

Details and statistics

DOI: 10.1002/CTA.3027

access: closed

type: Journal Article

metadata version: 2021-12-15

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijcta/HsiehWYL21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcta/HsiehWYL21
Chun-Ting Hsieh, Shang-Hsien Wang, Chun-Wei Yeh, Wei-Cheng Lin:
Reliability evaluation and redesign methodology for RFCMOS transceiver frontend circuits in sub-6-GHz band of fifth-generation new radio communication based on the reliability model. Int. J. Circuit Theory Appl. 49(10): 3443-3454 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.