"Design framework for high-performance optimal sampled-data control with ..."

Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra (2007)

> Home

Details and statistics

DOI: 10.1080/00207170701216329

access: closed

type: Journal Article

metadata version: 2019-07-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijcon/OomenWB07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcon/OomenWB07
Tom Oomen, Marc M. J. van de Wal, Okko H. Bosgra:
Design framework for high-performance optimal sampled-data control with application to a wafer stage. Int. J. Control 80(6): 919-934 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.