"Investigation of carrier Mobility degradation effects on MOSFET Leakage ..."

Hippolyte Djonon Tsague, Bhekisipho Twala (2016)

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DOI: 10.47839/IJC.15.4.855

access: open

type: Journal Article

metadata version: 2024-07-24

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Hippolyte Djonon Tsague, Bhekisipho Twala:
Investigation of carrier Mobility degradation effects on MOSFET Leakage simulations. Int. J. Comput. 15: 237-247 (2016)

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