"Extend Tversky's Ratio Model to an Asymmetric Similarity Measurement Model ..."

Wen He et al. (2023)

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DOI: 10.1007/S44196-023-00285-8

access: open

type: Journal Article

metadata version: 2024-05-07

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  - journals/ijcisys/HeDLR23
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  - https://dblp.org/rec/journals/ijcisys/HeDLR23
Wen He, Bapi Dutta, Yaya Liu, Rosa M. Rodríguez:
Extend Tversky's Ratio Model to an Asymmetric Similarity Measurement Model with Three Conditional Parameters: 3p-ASM Model. Int. J. Comput. Intell. Syst. 16(1): 113 (2023)

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