"Learning with supervised data for anomaly detection in smart manufacturing."

Meiling He et al. (2023)

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DOI: 10.1080/0951192X.2023.2177747

access: closed

type: Journal Article

metadata version: 2023-10-14

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  - https://dblp.org/rec/journals/ijcim/HePLOM23
Meiling He, Matthew E. H. Petering, Phillip M. LaCasse, Wilkistar Otieno, Francisco P. Maturana:
Learning with supervised data for anomaly detection in smart manufacturing. Int. J. Comput. Integr. Manuf. 36(9): 1331-1344 (2023)

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