"Efficient don't care filling and scan chain masking for low-power testing."

Subhadip Kundu, Santanu Chattopadhyay (2012)

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DOI: 10.1504/IJCAET.2012.045652

access: closed

type: Journal Article

metadata version: 2020-03-24

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Subhadip Kundu, Santanu Chattopadhyay:
Efficient don't care filling and scan chain masking for low-power testing. Int. J. Comput. Aided Eng. Technol. 4(2): 101-125 (2012)

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