"Gate level leakage minimisation at 90 nm technology."

Angshuman Chakraborty, Sambhu Nath Pradhan (2013)

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DOI: 10.1504/IJCAET.2013.056816

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type: Journal Article

metadata version: 2022-04-09

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Angshuman Chakraborty, Sambhu Nath Pradhan:
Gate level leakage minimisation at 90 nm technology. Int. J. Comput. Aided Eng. Technol. 5(4): 375-386 (2013)

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