default search action
"High-Precision Aspheric Surface Measurement Using Scanning Deflectometry: ..."
Tingzhi Hu et al. (2017)
- Tingzhi Hu, Muzheng Xiao, Xicheng Wang, Chao Wang, Zhijing Zhang, Kiyoshi Takamasu:
High-Precision Aspheric Surface Measurement Using Scanning Deflectometry: Three-Dimensional Error Analysis and Experiments. Int. J. Autom. Technol. 11(5): 728-735 (2017)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.