"Guest Editorial: Machine learning applied to quality and security in ..."

Honghao Gao et al. (2023)

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DOI: 10.1049/SFW2.12141

access: open

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/iet-sen/GaoHBAY23
Honghao Gao, Walayat Hussain, Ramón J. Durán Barroso, Junaid Arshad, Yuyu Yin:
Guest Editorial: Machine learning applied to quality and security in software systems. IET Softw. 17(4): 345-347 (2023)

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