"Is triple modular redundancy suitable for yield improvement?"

Julien Vial et al. (2009)

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DOI: 10.1049/IET-CDT.2008.0127

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/VialVBGLP09
Julien Vial, Arnaud Virazel, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch:
Is triple modular redundancy suitable for yield improvement? IET Comput. Digit. Tech. 3(6): 581-592 (2009)

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