"An optimized knight traversal technique to detect multiple faults and ..."

Basudev Saha, Mukta Majumder (2021)

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DOI: 10.1049/CDT2.12004

access: open

type: Journal Article

metadata version: 2022-02-08

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  - https://dblp.org/rec/journals/iet-cdt/SahaM21
Basudev Saha, Mukta Majumder:
An optimized knight traversal technique to detect multiple faults and Module Sequence Graph based reconfiguration of microfluidic biochip. IET Comput. Digit. Tech. 15(1): 1-11 (2021)

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