"Sensitivity analysis of testability parameters for secure IC design."

Sreeja Rajendran, Mary Lourde Regeena (2020)

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DOI: 10.1049/IET-CDT.2019.0217

access: closed

type: Journal Article

metadata version: 2020-12-31

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  - https://dblp.org/rec/journals/iet-cdt/RajendranR20
Sreeja Rajendran, Mary Lourde Regeena:
Sensitivity analysis of testability parameters for secure IC design. IET Comput. Digit. Tech. 14(4): 158-165 (2020)

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