"Scan chain configuration based X-filling for low power and high quality ..."

Zhen Chen et al. (2010)

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DOI: 10.1049/IET-CDT.2008.0163

access: closed

type: Journal Article

metadata version: 2020-07-14

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Zhen Chen, J. Feng, Dong Xiang, Boxue Yin:
Scan chain configuration based X-filling for low power and high quality testing. IET Comput. Digit. Tech. 4(1): 1-13 (2010)

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