"Charge-based testing BIST for embedded memories."

Bartomeu Alorda, Ivan de Paúl, Jaume Segura (2007)

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DOI: 10.1049/IET-CDT:20060058

access: closed

type: Journal Article

metadata version: 2021-10-14

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Bartomeu Alorda, Ivan de Paúl, Jaume Segura:
Charge-based testing BIST for embedded memories. IET Comput. Digit. Tech. 1(5): 481-490 (2007)

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