"Wear-out stress monitor utilising temperature and voltage sensitive ring ..."

Kan Takeuchi et al. (2018)

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DOI: 10.1049/IET-CDS.2017.0153

access: closed

type: Journal Article

metadata version: 2020-09-10

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Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya:
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. IET Circuits Devices Syst. 12(2): 182-188 (2018)

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