"Statistical modelling of the variation in advanced process technologies ..."

Santosh Shedabale et al. (2008)

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DOI: 10.1049/IET-CDS:20080031

access: closed

type: Journal Article

metadata version: 2020-09-10

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  - https://dblp.org/rec/journals/iet-cds/ShedabaleRRYC08
Santosh Shedabale, Hiran Ramakrishnan, Gordon Russell, Alexandre Yakovlev, Sanatan Chattopadhyay:
Statistical modelling of the variation in advanced process technologies using a multi-level partitioned response. IET Circuits Devices Syst. 2(5): 451-464 (2008)

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