"Evaluation of Heavy-Ion-Induced Single Event Upset Cross Sections of a ..."

Kentaro Kojima et al. (2020)

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DOI: 10.1587/TRANSELE.2019CDP0007

access: closed

type: Journal Article

metadata version: 2021-01-18

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  - https://dblp.org/rec/journals/ieicetc/KojimaYFK20
Kentaro Kojima, Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi:
Evaluation of Heavy-Ion-Induced Single Event Upset Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Composed of Stacked Inverters. IEICE Trans. Electron. 103-C(4): 144-152 (2020)

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