"Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing."

Riaz-ul-haque Mian et al. (2024)

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DOI: 10.1587/TRANSFUN.2023EAP1115

access: closed

type: Journal Article

metadata version: 2024-10-06

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Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michihiro Shintani:
Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 107(8): 1139-1150 (2024)

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