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"Exposure-Resilient Identity-Based Dynamic Multi-Cast Key Distribution."
Kazuki Yoneyama et al. (2018)
- Kazuki Yoneyama, Reo Yoshida, Yuto Kawahara, Tetsutaro Kobayashi, Hitoshi Fuji, Tomohide Yamamoto:
Exposure-Resilient Identity-Based Dynamic Multi-Cast Key Distribution. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 101-A(6): 929-944 (2018)
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