"SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by ..."

Jun Yamashita et al. (2013)

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DOI: 10.1587/TRANSFUN.E96.A.2561

access: closed

type: Journal Article

metadata version: 2020-04-11

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Jun Yamashita, Hiroyuki Yotsuyanagi, Masaki Hashizume, Kozo Kinoshita:
SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 96-A(12): 2561-2567 (2013)

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