"Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real ..."

Yusuke Yamaga et al. (2018)

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DOI: 10.1587/TRANSELE.E101.C.243

access: closed

type: Journal Article

metadata version: 2020-04-11

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Yusuke Yamaga, Chihiro Matsui, Yukiya Sakaki, Ken Takeuchi:
Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test. IEICE Trans. Electron. 101-C(4): 243-252 (2018)

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