"RF MOSFET Characterization by Four-Port Measurement."

Shih-Dao Wu et al. (2005)

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DOI: 10.1093/IETELE/E88-C.5.851

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type: Journal Article

metadata version: 2020-04-11

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Shih-Dao Wu, Guo-Wei Huang, Kun-Ming Chen, Hua-Chou Tseng, Tsun-Lai Hsu, Chun-Yen Chang:
RF MOSFET Characterization by Four-Port Measurement. IEICE Trans. Electron. 88-C(5): 851-856 (2005)

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