"Study on Contact Failure Mechanisms of Accelerated Life Test for Relay ..."

Shujuan Wang et al. (2009)

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DOI: 10.1587/TRANSELE.E92.C.1034

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/WangYRR09
Shujuan Wang, Qiong Yu, Li Ren, Wanbin Ren:
Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability. IEICE Trans. Electron. 92-C(8): 1034-1039 (2009)

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