"On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST."

Akihiro Tomita et al. (2014)

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DOI: 10.1587/TRANSINF.2014EDP7039

access: closed

type: Journal Article

metadata version: 2020-04-11

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Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang:
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST. IEICE Trans. Inf. Syst. 97-D(10): 2706-2718 (2014)

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