"An Effective Testing Method for Hardware Related Fault in Embedded Software."

Takeshi Sumi et al. (2005)

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DOI: 10.1093/IETISY/E88-D.6.1142

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type: Journal Article

metadata version: 2023-06-26

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Takeshi Sumi, Osamu Mizuno, Tohru Kikuno, Masayuki Hirayama:
An Effective Testing Method for Hardware Related Fault in Embedded Software. IEICE Trans. Inf. Syst. 88-D(6): 1142-1149 (2005)

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