"An Effective Programmable Memory BIST for Embedded Memory."

Youngkyu Park et al. (2009)

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DOI: 10.1587/TRANSINF.E92.D.2508

access: closed

type: Journal Article

metadata version: 2024-07-15

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Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang:
An Effective Programmable Memory BIST for Embedded Memory. IEICE Trans. Inf. Syst. 92-D(12): 2508-2511 (2009)

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