"New Approach of Laser-SQUID Microscopy to LSI Failure Analysis."

Kiyoshi Nikawa et al. (2009)

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DOI: 10.1587/TRANSELE.E92.C.327

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/NikawaINMMN09
Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae:
New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. IEICE Trans. Electron. 92-C(3): 327-333 (2009)

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