"A Method of Current Testing for CMOS Digital and Mixed-Signal LSIs."

Yukiya Miura, Sachio Naito (1995)

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DOI: —

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type: Journal Article

metadata version: 2020-04-11

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Yukiya Miura, Sachio Naito:
A Method of Current Testing for CMOS Digital and Mixed-Signal LSIs. IEICE Trans. Inf. Syst. 78-D(7): 845-852 (1995)

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