"Detection of CMOS Open Node Defects by Frequency Analysis."

Hiroyuki Michinishi et al. (2007)

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DOI: 10.1093/IETISY/E90-D.3.685

access: closed

type: Journal Article

metadata version: 2020-04-11

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Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo:
Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Trans. Inf. Syst. 90-D(3): 685-687 (2007)

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