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"Accurate Extraction of the Trap Depth from RTS Noise Data by Including ..."
Hochul Lee et al. (2007)
- Hochul Lee, Youngchang Yoon, Seongjae Cho, Hyungcheol Shin:
Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. IEICE Trans. Electron. 90-C(5): 968-972 (2007)
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