"Effect of a Guard-Ring on the Leakage Current in a Si-PIN X-Ray Detector ..."

Jin-Young Kim et al. (2008)

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DOI: 10.1093/IETELE/E91-C.5.703

access: closed

type: Journal Article

metadata version: 2020-04-11

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Jin-Young Kim, Jung-Ho Seo, Hyun-Woo Lim, Chang-Hyun Ban, Kyu-Chae Kim, Jin-Goo Park, Sung-Chae Jeon, Bong-Hoe Kim, Seung-Oh Jin, Young Hu:
Effect of a Guard-Ring on the Leakage Current in a Si-PIN X-Ray Detector for a Single Photon Counting Sensor. IEICE Trans. Electron. 91-C(5): 703-707 (2008)

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