"Selective Scan Slice Grouping Technique for Efficient Test Data Compression."

YongJoon Kim, Jaeseok Park, Sungho Kang (2010)

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DOI: 10.1587/TRANSINF.E93.D.380

access: closed

type: Journal Article

metadata version: 2024-02-27

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YongJoon Kim, Jaeseok Park, Sungho Kang:
Selective Scan Slice Grouping Technique for Efficient Test Data Compression. IEICE Trans. Inf. Syst. 93-D(2): 380-383 (2010)

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